| REN Bin (任 彬)* **,ZHOU Qinyu*,LI Qibing*,LUO Wenfa***.[J].高技术通讯(英文),2023,29(4):434~444 |
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| Research on cognitive load evaluation with subjective method in manual assembly |
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| DOI： |
| 中文关键词: |
| 英文关键词: assembly worker, electroencephalogram ( EEG), analytic hierarchy process(AHP), National Aeronautics and Space Administration Task Load Index (NASA-TLX) scale,
subjective evaluation, scale applicability |
| 基金项目: |
| Author Name | Affiliation | | REN Bin (任 彬)* ** | (* Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation,
Shanghai University, Shanghai 200444, P. R. China)
(** Zhejiang Key Laboratory of Robotics and Intelligent Manufacturing Equipment Technology, Ningbo Institute of
Materials Technology & Engineering, Chinese Academy of Sciences, Ningbo 315201, P. R. China)
(*** SAIC Motor R&D Innovation Headquarters, SAIC Motor Corporation Limited, Shanghai 201804, P. R. China) | | ZHOU Qinyu* | | | LI Qibing* | | | LUO Wenfa*** | |
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| 中文摘要: |
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| 英文摘要: |
| Subjective scales have different kinds of applicability in diverse fields. This study intends to
implement a quantitative approach to determine the applicability of subjective scales in manual assembly
work and evaluate the cognitive load of assembly workers. A multi-scale research paradigm
based on subjective evaluation method is proposed. Three typical task stages are extracted from the
process of assembly work. The National Aeronautics and Space Administration Task Load Index
(NASA-TLX) scale, PAAS scale and Workload Profile Index Ratings (WP) scale are selected for
the design of 3 ×3 multi-factor mixed experiment. The power spectrum density (PSD) characteristics
of electroencephalogram (EEG) are utilized to identify the difficulty levels of the three task stages.
The relevant indicators of scale applicability are assessed. The results show that in terms of
sensitivity, NASA-TLX scale reaches the highest sensitivity (F =999. 137, P =0 <0. 05). In terms
of validity, NASA-TLX scale possesses the best concurrent validity (P =0. 0255 <0. 05). In terms
of diagnosticity, NASA-TLX scale based on 6 dimensions takes on the best diagnostic performance.
In terms of subject acceptability, WP scale performs the worst. According to the analytic hierarchy
process (AHP) model, the applicability scores of NASA-TLX scale, PAAS scale and WP scale are
determined as 3, 2. 55 and 1. 6714, respectively. Therefore, NASA-TLX scale is regarded as the
most suitable subjective evaluation questionnaire for assembly workers, which is also an effective
quantitative evaluation method for the cognitive load of assembly workers. |
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