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  • Contents
    2022 ,28(1):-[Abstract](248)[PDF](187)
  • YAN Zhenzhen (闫珍珍)，LI Bo，YANG Mao，YAN Zhongjiang
    2022 ,28(1):1-9[Abstract](117)[PDF](170)
  • YANG Zhaoxin (杨兆鑫)*，YANG Ruizhe*，LI Meng*，YU Richard Fei* **，ZHANG Yanhua*
    2022 ,28(1):10-20[Abstract](137)[PDF](131)
  • REN Bin(任彬)，PAN Yunjie
    2022 ,28(1):21-29[Abstract](110)[PDF](102)
  • ZHAO Jing(赵京)*，DUAN Yaxing*，ZHANG Ziqiang*，XIE Biyun**
    2022 ,28(1):30-39[Abstract](238)[PDF](415)
  • XIE Xiaoyan(谢晓燕)*，JI Shentao*，ZHU Yun**，YANG Kun**，XIA Xinyuan**，WANG Shuxin*
    2022 ,28(1):40-47[Abstract](98)[PDF](106)
  • ZHAO Wencang (赵文仓)，WANG Chunxin，XU Changkai
    2022 ,28(1):48-55[Abstract](117)[PDF](103)
  • YANG Kun（杨堃），DUAN Yong
    2022 ,28(1):56-62[Abstract](104)[PDF](236)
  • WU Jin(吴进)，SHI Qianwen，XI Meng，WANG Lei，ZENG Huadie
    2022 ,28(1):63-71[Abstract](108)[PDF](101)
  • ZHAO Jianhua（赵建华）* ** ***，ZHAO Yabin**，ZHANG Xuze*，WANG Jin*，WANG Ziqi*，GAO Dianrong*，DU Guojun***
    2022 ,28(1):72-79[Abstract](108)[PDF](116)
  • ZHAO Chengze(赵铖泽)*，LI Meng* **，SUN Enchang*，HUO Ru*，LI Yu***，ZHANG Yanhua* **
    2022 ,28(1):80-90[Abstract](117)[PDF](126)
  • ZENG Wen（曾文），ZHENG Jia，WANG Dawei，XIONG Shuling，ZHANG Lei，WEI Xiaoqi
    2022 ,28(1):91-97[Abstract](97)[PDF](143)
  • MA Xiuhui (马秀慧) * **，WANG Rong***，CHEN Shudong* **，DU Rong* **，ZHU Danyang* **，ZHAO Hua***
    2022 ,28(1):98-106[Abstract](109)[PDF](105)
  • XU Lei (徐磊)，LI Weifeng，YAO Yijing，CHANG Jing，FANG Hongyu，LI Xiaohui
    2022 ,28(1):107-114[Abstract](164)[PDF](103)

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    27 (4)

  • 2021
    27 (3)

  • 2021
    27 (2)

  • 2021
    27 (1)

  • 2020
    26 (4)

Copyright information

  • Supervised by:

    Ministry of Science and Technology of the People's Republic of China

  • Sponsored by:

    Institute of Scientific and Technical Information of China

  • Published by:

    High Technology Letters Press

  • Add:

    54 Sanlihe Road, High Technology Letters, Beijing 100045 P.R.China

  • Tel:

    86-10-68514060 68598272

  • E-mail:

    hitech@istic.ac.cn

  • CN：

    11-3683/N

  • ISSN：

    1006-6748

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